Bernard Courtois - researchr alias

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2019

Special Session (New Topic): Emerging Computing and Testing TechniquesMax M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois. vts 2019: 1-2 [doi]

2018

Special session on quantum systems: Next challenges in design, test, integrationCarlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois. vts 2018: 1 [doi]

2014

Special Section NANOTECH 2013Bernard Courtois. mj, 45(7):930, 2014. [doi]

New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensorsBozena Kaminska, Bernard Courtois, Bozena Kaminska, Mary Ann Maher. vts 2014: 1 [doi]

New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challengesBozena Kaminska, Bernard Courtois, Chris Bailey. vts 2014: 1 [doi]

2013

2012

Special section NANOTECH 2011Bernard Courtois. mj, 43(5):299, 2012. [doi]

2010

ICs and MEMS for energy managementBernard Courtois. latw 2010: 1 [doi]

2009

2008

European Nano Systems 2006Bernard Courtois. mj, 39(8):1031, 2008. [doi]

2006

Session AbstractBernard Courtois. vts 2006: 150-151 [doi]

2005

Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004Bernard Courtois. mj, 36(7):613, 2005. [doi]

2004

Infrastructures for Education, Research and Industry in Microelectronics - A reviewBernard Courtois. delta 2004: 149-156 [doi]

On-chip testing of embedded silicon transducersSalvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois. socc 2004: 13-18 [doi]

On-chip testing of embedded transducersSalvador Mir, Libor Rufer, Bernard Courtois. vlsid 2004: 463 [doi]

2003

Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten EntwicklungenBernard Courtois. it, 45(6):318-326, 2003. [doi]

2001

2000

Analog ALC crystal oscillators for high-temperature applicationsRaúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois. jssc, 35(1):2-14, 2000. [doi]

Design of self-checking fully differential circuits and boardsMarcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois. tvlsi, 8(2):113-128, 2000. [doi]

Extending Fault-Based Testing to Microelectromechanical SystemsSalvador Mir, Benoît Charlot, Bernard Courtois. et, 16(3):279-288, 2000. [doi]

Towards design and validation of mixed-technology SOCsSalvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz. glvlsi 2000: 29-33 [doi]

IDDQ Testing of Submicron CMOS - by Cooling?Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois. et, 16(5):453-461, 2000. [doi]

1999

1998

1997

1996

Second Therminic WorkshopBernard Courtois. dt, 13(4):5, 1996.

Guest Editors Introduction: Mixed Analog and Digital SystemsBozena Kaminska, Bernard Courtois. dt, 13(2):8-9, 1996.

Guest editorialBozena Kaminska, Bernard Courtois. et, 9(1-2):7-8, 1996. [doi]

High level CAD melds microsystems with foundriesJean-Michel Karam, Bernard Courtois, M. Bauge. date 1996: 442-447 [doi]

Applied design and analysis of microsystemsJean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimir Székely. date 1996: 528-532 [doi]

Automatic Test Generation for Maximal Diagnosis of Linear Analogue CircuitsSalvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik. date 1996: 254-258 [doi]

Fault-based ATPG for linear analog circuits with minimal size multifrequency test setsSalvador Mir, Marcelo Lubaszewski, Bernard Courtois. et, 9(1-2):43-57, 1996. [doi]

Unified built-in self-test for fully differential analog circuitsSalvador Mir, Marcelo Lubaszewski, Bernard Courtois. et, 9(1-2):135-151, 1996. [doi]

Thermal Monitoring Of Safety-Critical Integrated SystemsVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois. ats 1996: 282-288 [doi]

1995

Panel: New Research Problems in the Emerging Test TechnologyVishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri. ats 1995: 189 [doi]

Conference ReportsSreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois. dt, 12(4):95-97, 1995.

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift RegistersSybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois. TC, 44(2):223-233, 1995.

Analog checkers with absolute and relative tolerancesVladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois. tcad, 14(5):607-612, 1995. [doi]

Mixed-signal circuits and boards for high safety applicationsMarcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois. date 1995: 34-41 [doi]

Frequency-based BIST for analog circuit testinKhaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski. vts 1995: 54-59 [doi]

1994

Designing self-exercising analogue checkersVladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois. vts 1994: 252-257 [doi]

Built-in self-test and fault diagnosis of fully differential analogue circuitsSalvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois. iccad 1994: 486-490 [doi]

1993

Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation EnvironmentsF. L. Vargas, Michael Nicolaidis, Bernard Courtois. iccd 1993: 596-600

1992

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift RegistersSybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski. itc 1992: 120-129

Towards System level modeling and synthesisAhmed Amine Jerraya, Kevin O'Brien, Inhag Park, Bernard Courtois. vlsid 1992: 91-96 [doi]

On the Design of Self-Checking Boundary Scannable BoardsMarcelo Lubaszewski, Bernard Courtois. itc 1992: 372-381

1991

Built-In Self-Test for Multi-Port RAMsVladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois. iccad 1991: 248-251

Coupling Electron-Beam Probing with Knowledge-Based Fault LocalizationM. Marzouki, J. Laurent, Bernard Courtois. itc 1991: 238-247

Silicon compilation of hierarchical control sections with unified BIST testabilityMichael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois. mam, 15(5):257-269, 1991. [doi]

1990

NAUTILE: a safe environment for silicon compilationP. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas. eurodac 1990: 605-609 [doi]

1989

Random Pattern Testing Versus Deterministic Testing of RAM sRené David, Antoine Fuentes, Bernard Courtois. TC, 38(5):637-650, 1989.

A generalized theory of fail-safe systemsMichael Nicolaidis, S. Noraz, Bernard Courtois. ftcs 1989: 398-406 [doi]

Self-checking logic arraysMichael Nicolaidis, Bernard Courtois. mam, 13(4):281-290, 1989. [doi]

1988

Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch LevelJean Paul Caisso, Bernard Courtois. itc 1988: 94-101

Definition and Design of Strongly Language Disjoint CheckersIngrid Jansch, Bernard Courtois. TC, 37(6):745-748, 1988.

Strongly Code Disjoint CheckersMichael Nicolaidis, Bernard Courtois. TC, 37(6):751-756, 1988.

UBIST version of the SYCO's control section compilerKholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois. iccd 1988: 392-396 [doi]

1986

Scanning the issueBernard Courtois, Marco Mezzalama. pieee, 74(5):627-628, 1986. [doi]

Principles of the SYCO compilerAhmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois. dac 1986: 715-721 [doi]

Towards Automatic Failure Analysis of Complex ICs Through E-Beam TestingJ. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin. itc 1986: 465-473

1984

Functional testing vs. structural testing of RAMsH. Sahami, Bernard Courtois. icftcs 1984: 391-403

1983

A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processingC. Rubat Du Merac, P. Jutier, J. Laurent, Bernard Courtois. prl, 1(5-6):347-352, 1983. [doi]

1981

Analytical Testing of Data Processing Sections of Integrated CPUsBernard Courtois. itc 1981: 21-30

1976

Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coûtBernard Courtois. PhD thesis, Grenoble Institute of Technology, France, 1976. [doi]

1975

On balancing hardware-firmware for designing a fault-tolerant computers' seriesBernard Courtois, Gabriele Saucier. micro 1975: 1-5 [doi]

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