Come Rozon - researchr alias

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Viewing Publication 1 - 19 from 19

2013

Ultra-Low Leakage Arithmetic Circuits Using Symmetric and Asymmetric FinFETsFarid Moshgelani, Dhamin Al-Khalili, Come Rozon. jece, 2013, 2013. [doi]

2012

Ultra low leakage structures for logic circuits using symmetric and asymmetric FinFETsFarid Moshgelani, Dhamin Al-Khalili, Come Rozon. newcas 2012: 385-388 [doi]

2011

A CNFET-based characterization framework for digital circuitsJacques L. Athow, Come Rozon, Dhamin Al-Khalili, J. M. Pierre Langlois. icecsys 2011: 681-684 [doi]

2008

UDSM subthreshold leakage model for NMOS transistor stacksHussam Al-Hertani, Dhamin Al-Khalili, Come Rozon. mj, 39(12):1809-1816, 2008. [doi]

2006

Accurate Total Static Leakage Current Estimation in Transistor StacksHussam Al-Hertani, Dhamin Al-Khalili, Come Rozon. aiccsa 2006: 262-265 [doi]

Automatic generation of defect injectable VHDL fault models for ASIC standard cell librariesDonald B. Shaw, Dhamin Al-Khalili, Come Rozon. integration, 39(4):382-406, 2006. [doi]

2005

Leakage power dissipation in UDSM logic gatesHussam Al-Hertani, Dhamin Al-Khalili, Come Rozon. iastedCCS 2005: 132-136

2003

IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL SaboteursDonald B. Shaw, Dhamin Al-Khalili, Come Rozon. TC, 52(10):1285-1297, 2003. [doi]

2002

Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL modelsDonald B. Shaw, Dhamin Al-Khalili, Come Rozon. integration, 32(1-2):77-97, 2002. [doi]

2001

Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulationDonald B. Shaw, Dhamin Al-Khalili, Come Rozon. iscas 2001: 263-266 [doi]

Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL SaboteursDonald B. Shaw, Dhamin Al-Khalili, Come Rozon. iccad 2001: 531-536 [doi]

2000

Comprehensive defect analysis and testability of current-mode logic circuitsSaman Adham, Dhamin Al-Khalili, Come Rozon, D. Raez. iscas 2000: 339-342 [doi]

1998

Comprehensive Defect Analysis and Defect Coverage of CMOS CircuitsDhamin Al-Khalili, Saman Adham, Come Rozon, Moazzem Hossain, D. Racz. dft 1998: 84-92 [doi]

VHDL Modelling and Analysis of Fault Secure SystemsJason Coppens, Dhamin Al-Khalili, Come Rozon. date 1998: 148-152 [doi]

1996

On the Use of VHDL as a Multi-Valued Logic SimulatorCome Rozon. ismvl 1996: 110 [doi]

1995

Improved VLSI Design for Decoding Concatenated Codes Comprising an Irreducible Cyclic Code and a Reed-Solomon CodeD. B. Gravel, Germain Drolet, Come Rozon. ita 1996: 104-110

1993

Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS CircuitsMichael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon. iscas 1993: 1714-1717

1992

Testability analysis and fault modeling of BiCMOS circuitsDhamin Al-Khalili, Come Rozon, B. Stewart. et, 3(3):207-217, 1992. [doi]

1991

Testability Analysis of CMOS Temary CircuitsCome Rozon, H. T. Mouftah. ismvl 1991: 158-165

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