Guido Gronthoud - researchr alias

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2009

Algorithms for ADC Multi-site Test with Digital Input StimulusXiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud. ets 2009: 45-50 [doi]

2008

Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based DesignVladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans de Jong. ets 2008: 27-32 [doi]

2007

2006

A Gate-Level Method for Transistor-Level Bridging Fault DiagnosisXinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud. vts 2006: 266-271 [doi]

Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated CircuitsAmir Zjajo, José Pineda de Gyvez, Guido Gronthoud. et, 22(4-6):399-409, 2006. [doi]

2005

2004

Power Supply Ramping for Quasi-static Testing of PLLsJosé Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller. itc 2003: 980-987 [doi]

On Hazard-free Patterns for Fine-delay Fault TestingBram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger. itc 2003: 213-222 [doi]

2003

VDD Ramp Testing for RF CircuitsJosé Pineda de Gyvez, Guido Gronthoud, Rashid Amine. itc 2003: 651-658 [doi]

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault ModelAnanta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger. vts 2003: 345-350 [doi]

2000

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg. itc 2000: 95-104