1998
1997
1995
1994
- In-Process Improvement through Defect Data InterpretationInderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, C. Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa. IBMSJ, 33(1):182-214, 1994.
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