Keith Baker - researchr alias

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2007

Torque Kills! Future Control of the Ambient Electromagnetic SpectrumKeith Baker. ieeemm, 14(1):4-8, 2007. [doi]

2006

Intrusive Interactivity Is Not an Ambient ExperienceKeith Baker. ieeemm, 13(2):4-7, 2006. [doi]

2004

The Grid2003 Production Grid: Principles and PracticeIan T. Foster, Jerry Gieraltowski, Scott Gose, Natalia Maltsev, Edward N. May, Alex Rodriguez, Dinanath Sulakhe, A. Vaniachine, Jim Shank, Saul Youssef, David Adams, Richard Baker, Wensheng Deng, Jason Smith, Dantong Yu, Iosif Legrand, Suresh Singh, Conrad Steenberg, Yang Xia, M. Anzar Afaq, Eileen Berman, James Annis, L. A. T. Bauerdick, Michael Ernst, Ian Fisk, Lisa Giacchetti, Gregory E. Graham, Anne Heavey, Joseph Kaiser, Nickolai Kuropatkin, Ruth Pordes, Vijay Sekhri, John Weigand, Yujun Wu, Keith Baker, Lawrence Sorrillo, John Huth, Matthew Allen, Leigh Grundhoefer, John Hicks, Fred Luehring, Steve Peck, Rob Quick, Stephen Simms, George Fekete, Jan vandenBerg, Kihyeon Cho, Kihwan Kwon, Dongchul Son, Hyoungwoo Park, Shane Canon, Keith R. Jackson, David E. Konerding, Jason Lee, Doug Olson, Iowa Sakrejda, Brian Tierney, Mark Green, Russ Miller, James Letts, Terrence Martin, David Bury, Catalin Dumitrescu, Daniel Engh, Robert Gardner, Marco Mambelli, Yuri Smirnov, Jens-S. Vöckler, Michael Wilde, Yong Zhao, Xin Zhao, Paul Avery, Richard Cavanaugh, Bockjoo Kim, Craig Prescott, Jorge Luis Rodriguez, Andrew Zahn, Shawn McKee, Christopher T. Jordan, James E. Prewett, Timothy L. Thomas, Horst Severini, Ben Clifford, Ewa Deelman, Larry Flon, Carl Kesselman, Gaurang Mehta, Nosa Olomu, Karan Vahi, Kaushik De, Patrick McGuigan, Mark Sosebee, Dan Bradley, Peter Couvares, Alan DeSmet, Carey Kireyev, Erik Paulson, Alain Roy, Scott Koranda, Brian Moe, Bobby Brown, Paul Sheldon. hpdc 2004: 236-245 [doi]

2000

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg. itc 2000: 95-104

1999

SIA Roadmaps: Sunset Boulevard for l_DDQKeith Baker. itc 1999: 1121

1998

Spice up your life: simulate mixed-signal ICs!Keith Baker. itc 1998: 1131 [doi]

1997

Shmoo Plotting: The Black Art of IC TestingKeith Baker, Jos van Beers. dt, 14(3):90-97, 1997. [doi]

1996

Shmoo Plots - the Black Art of IC TestKeith Baker, Jos van Beers. itc 1996: 932-933

1995

Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say?Keith Baker. itc 1995: 299

Plug & Play I::DDQ:: Monitoring with QTAGKeith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen. itc 1995: 739-749

Plug-and-Play IDDQ Testing for Test FixturesKeith Baker, Alan Hales. dt, 12(3):53-61, 1995. [doi]

1994

1993

Parameter Monitoring: Advantages and PitfallsM. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess. itc 1993: 115-124

1992

Time-to-Market: An Issue in Mixed-signal vs. AnalogueKeith Baker. itc 1992: 254

Improving Total IC Design Quality Using Application Mode TestingR. Mehtani, M. De Jonghe, Richard Morren, Keith Baker. itc 1992: 866-872

Using EDIF for Transfer of Test Data: Practical ExperienceBas Verhelst, Richard Morren, Keith Baker. itc 1992: 459-465

1990

5th Alvey vision ConferenceKate Crennell, Keith Baker. ivc, 8(1):2-3, 1990. [doi]

1987

A Fast Signature Simulation Tool for Built-In Self-Testing CircuitsS. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter. dac 1987: 17-25 [doi]

1985

Alvey computer vision and image interpretation research programmesKeith Baker. ivc, 3(4):146-151, 1985. [doi]

1984

An Analysis of the Economics of Self TestPrab Varma, Anthony P. Ambler, Keith Baker. itc 1984: 20-30