Mike W. T. Wong - researchr alias

researchr

You are not signed in
Sign in
Sign up

2004

Design and Implementation of Self-Testable Full Range Window ComparatorMike W. T. Wong, Yubin Zhang. ats 2004: 314-318 [doi]

2003

Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault AnalysisMike W. T. Wong. ats 2003: 120-123 [doi]

2002

Testing System-On-Chip by Summations of Cores? Test Output VoltagesK. Y. Ko, Mike W. T. Wong, Y. S. Lee. ats 2002: 350-355 [doi]

Analog and Mixed-Signal IP Cores TestingMike W. T. Wong, K. Y. Ko, Y. S. Lee. delta 2002: 3-7 [doi]

Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault AnalysisMatthew Worsman, Mike W. T. Wong, Y. S. Lee. delta 2002: 443-446 [doi]

2000

New built-in self-test technique based on addition/subtraction of selected node voltagesK. Y. Ko, Mike W. T. Wong. ats 2000: 39 [doi]

Analog circuit equivalent faults in the D.C. domainMatthew Worsman, Mike W. T. Wong, Y. S. Lee. ats 2000: 84-89 [doi]

A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis QualityMatthew Worsman, Mike W. T. Wong, Y. S. Lee. isqed 2000: 361-368 [doi]

1998

DC Nonlinear Circuit Fault Simulation With Large Change SensitivityMike W. T. Wong, Matthew Worsman. ats 1998: 366-371 [doi]

1997

Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking CircuitsJoseph C. W. Pang, Mike W. T. Wong, Y. S. Lee. ats 1997: 82-87 [doi]

1996

Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity ComputationTao Wei, Mike W. T. Wong, Y. S. Lee. ats 1996: 232-237 [doi]

Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysisYingquan Zhou, Mike W. T. Wong, Yinghua Min. et, 9(1-2):153-163, 1996. [doi]

1995

Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog CheckersYingquan Zhou, Mike W. T. Wong, Yinghua Min. ftcs 1995: 238-247