Piero Olivo - researchr alias

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Viewing Publication 1 - 66 from 66

2022

2021

Optimized programming algorithms for multilevel RRAM in hardware neural networksValerio Milo, Francesco Anzalone, Cristian Zambelli, Eduardo Pérez, Mamathamba Kalishettyhalli Mahadevaiah, Oscar Gonzalez Ossorio, Piero Olivo, Christian Wenger, Daniele Ielmini. irps 2021: 1-6 [doi]

2019

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic ComputingM. K. Mahadevaiah, E. Perez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, F. Zahari, H. Kohlstedt, M. Ziegler. irps 2019: 1-4 [doi]

Low-energy inference machine with multilevel HfO2 RRAM arraysValerio Milo, Cristian Zambelli, Piero Olivo, Eduardo Pérez, O. G. Ossorio, Christian Wenger, Daniele Ielmini. essderc 2019: 174-177 [doi]

Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSDCristian Zambelli, Riccardo Bertaggia, Lorenzo Zuolo, Rino Micheloni, Piero Olivo. tcas, 66-II(10):1738-1742, 2019. [doi]

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State DrivesLorenzo Zuolo, Cristian Zambelli, Alessia Marelli, Rino Micheloni, Piero Olivo. tetc, 7(3):507-515, 2019. [doi]

2018

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAMAlessandro Grossi, Elisa Vianello, Cristian Zambelli, Pablo Royer, Jean-Philippe Noel, Bastien Giraud, Luca Perniola, Piero Olivo, Etienne Nowak. tvlsi, 26(12):2599-2607, 2018. [doi]

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM ArraysAlessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay. tetc, 6(2):269-277, 2018. [doi]

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and StorageFrancesco Pieri, Cristian Zambelli, Andrea Nannini, Piero Olivo, Sergio Saponara. cem, 7(5):8-17, 2018. [doi]

Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAsCristian Zambelli, Marco Castellari, Piero Olivo, Davide Bertozzi. ngcas 2018: 21-24 [doi]

2017

Solid-State Drives (SSDs) [Scanning the Issue]Rino Micheloni, Piero Olivo. pieee, 105(9):1586-1588, 2017. [doi]

Architectural and Integration Options for 3D NAND Flash MemoriesRino Micheloni, Luca Crippa, Cristian Zambelli, Piero Olivo. computers, 6(3):27, 2017. [doi]

Solid-State Drives: Memory Driven Design Methodologies for Optimal PerformanceLorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Piero Olivo. pieee, 105(9):1589-1608, 2017. [doi]

2016

Reliability of 3D NAND Flash MemoriesAlessandro Grossi, Cristian Zambelli, Piero Olivo. In Rino Micheloni, editor, 3D Flash Memories. pages 29-62, Springer, 2016. [doi]

2015

Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash ControllersDavide Bertozzi, Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Piero Olivo, Paolo Prinetto, Cristian Zambelli. tecs, 14(1):7, 2015. [doi]

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditionsAlessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay. nvmts 2015: 1-4 [doi]

Automated characterization of TAS-MRAM test arraysAlessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay. dtis 2015: 1-2 [doi]

RRAM Reliability/Performance Characterization through Array Architectures InvestigationsCristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger. isvlsi 2015: 327-332 [doi]

Design space exploration of latency and bandwidth in RRAM-based solid state drivesLorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Stephen Bates, Piero Olivo. nvmts 2015: 1-4 [doi]

SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State DrivesLorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Marco Indaco, Stefano Di Carlo, Paolo Prinetto, Davide Bertozzi, Piero Olivo. tcad, 34(10):1627-1638, 2015. [doi]

2014

2013

System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systemsLorenzo Zuolo, Gabriele Miorandi, Cristian Zambelli, Piero Olivo, Davide Bertozzi. issoc 2013: 1-6 [doi]

2012

Modeling of SET seasoning effects in Phase Change Memory arraysC. Zambelli, Andrea Chimenton, Piero Olivo. mr, 52(6):1060-1064, 2012. [doi]

A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memoriesC. Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, D. Bertozzi. date 2012: 881-886 [doi]

2011

Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability TradeoffC. Zambelli, D. Bertozzi, Andrea Chimenton, Piero Olivo. esl, 3(1):13-15, 2011. [doi]

2005

Reliability of erasing operation in NOR-Flash memoriesAndrea Chimenton, Piero Olivo. mr, 45(7-8):1094-1108, 2005. [doi]

2003

Overerase phenomena: an insight into flash memory reliabilityAndrea Chimenton, Paolo Pellati, Piero Olivo. pieee, 91(4):617-626, 2003. [doi]

2001

Automated test equipment for research on nonvolatile memoriesPaolo Pellati, Piero Olivo. tim, 50(5):1162-1166, 2001. [doi]

1998

A Bist Scheme for Non-Volatile MemoriesPiero Olivo, Marcello Dalpasso. et, 12(1-2):139-144, 1998. [doi]

1997

On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuitsCecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. tcad, 16(7):770-776, 1997. [doi]

Flash memory cells-an overviewPaolo Pavan, Roberto Bez, Piero Olivo, Enrico Zanoni. pieee, 85(8):1248-1271, 1997. [doi]

1996

Modeling and simulation of broken connections in CMOS IC sMichele Favalli, Marcello Dalpasso, Piero Olivo. tcad, 15(7):808-814, 1996. [doi]

Self-Learning Signature Analysis for Non-Volatile Memory TestingPiero Olivo, Marcello Dalpasso. itc 1996: 303-308

1995

1994

Modeling of Broken Connections Faults in CMOS ICsMichele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò. eurodac 1994: 159-164

1993

1992

Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICsMarcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò. itc 1992: 486-495

Testability measures in pseudorandom testingSilvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò. tcad, 11(6):794-800, 1992. [doi]

Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICsMichele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò. itc 1992: 466-475

A probabilistic fault model for analog faults in digital CMOS circuitsMichele Favalli, Piero Olivo, Bruno Riccò. tcad, 11(11):1459-1462, 1992. [doi]

Dynamic effects in the detection of bridging faults in CMOS ICsMichele Favalli, Piero Olivo, Bruno Riccò. et, 3(3):197-205, 1992. [doi]

CMOS Checkers with Testable Bridging and Transistor Stuck-on FaultsCecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. itc 1992: 948-957

1991

1990

Aliasing in signature analysis testing with multiple input shift registersMaurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò. tcad, 9(12):1344-1353, 1990. [doi]

2PROM aging and endurance: A case studyMassimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt. ett, 1(2):201-207, 1990. [doi]

1989

1988

Aliasing errors in signature analysis testing of integrated circuitsMaurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò. iccd 1988: 458-461 [doi]

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