2011
- New reliability mechanisms in memory design for sub-22nm technologiesNivard Aymerich, A. Asenov, A. Brown, Ramon Canal, B. Cheng, J. Figueras, Antonio González, Enric Herrero, S. Markov, M. Miranda, P. Pouyan, Tanausu Ramirez, Antonio Rubio, I. Vatajelu, Xavier Vera, X. Wang, P. Zuber. iolts 2011: 111-114 [doi]
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