Rosa Rodríguez-Montañés - researchr alias

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2010

Diagnosis of full open defects in interconnect lines with fan-outRosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. ets 2010: 233-238 [doi]

2008

Experimental Characterization of CMOS Interconnect Open DefectsDaniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras. tcad, 27(1):123-136, 2008. [doi]

Full Open Defects in Nanometric CMOSDaniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. vts 2008: 119-124 [doi]

2007

2006

Lissajous Based Mixed-Signal Testing for N-Observable SignalsL. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras. ddecs 2006: 125-130

2004

BIST Technique by Equally Spaced Test Vector SequencesSalvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras. vts 2004: 206-216 [doi]

Analog Switches in Programmable Analog Devices: Quiescent Defective BehavioursRosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras. et, 20(2):143-153, 2004. [doi]

2003

Threshold Voltage Mismatch (DeltaVT) Fault ModelingJosé Pineda de Gyvez, Rosa Rodríguez-Montañés. vts 2003: 145-150 [doi]

A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-ChipDoru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco. dsn 2003: 563-572 [doi]

2002

1998

IDDQ testing: state of the art and future trendsAntoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras. integration, 26(1-2):167-196, 1998. [doi]

Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICsRosa Rodríguez-Montañés, Joan Figueras. date 1998: 490-494 [doi]

1997

Bridges in sequential CMOS circuits: current-voltage signaturRosa Rodríguez-Montañés, Joan Figueras. vts 1997: 68-73 [doi]

1996

Bridging defects resistance in the metal layer of a CMOS processRosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras. et, 8(1):35-46, 1996. [doi]

1994

Analysis of Bridging Defects in Sequential CMOS Circuits and their Current TestabilityRosa Rodríguez-Montañés, Joan Figueras. eurodac 1994: 356-360

1992

Bridging Defects Resistance Measurements in a CMOS ProcessRosa Rodríguez-Montañés, Joan Figueras, Eric Bruls. itc 1992: 892-899

Quiescent current analysis and experimentation of defective CMOS circuitsJ. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio. et, 3(4):337-348, 1992. [doi]

1991

Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOSRosa Rodríguez-Montañés, J. A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio. itc 1991: 510-519