Rouwaida Kanj - researchr alias

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2011

A Novel Column-Decoupled 8T Cell for Low-Power Differential and Domino-Based SRAM DesignRajiv V. Joshi, Rouwaida Kanj, V. Ramadurai. tvlsi, 19(5):869-882, 2011. [doi]

The Impact of Statistical Leakage Models on Design Yield EstimationRouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif. vlsi, 2011, 2011. [doi]

2010

2009

Yield estimation of SRAM circuits using Virtual SRAM Fab Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das. iccad 2009: 631-636 [doi]

An elegant hardware-corroborated statistical repair and test methodology for conquering aging effectsRouwaida Kanj, Rajiv V. Joshi, Chad Adams, James Warnock, Sani R. Nassif. iccad 2009: 497-504 [doi]

Statistical yield analysis of silicon-on-insulator embedded DRAMRouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, W. Reohr, Sani R. Nassif, Kevin J. Nowka. isqed 2009: 190-194 [doi]

The impact of BEOL lithography effects on the SRAM cell performance and yieldYing Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi. isqed 2009: 607-612 [doi]

2008

2007

2006

2004

Noise characterization of static CMOS gatesRouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum. dac 2004: 888-893 [doi]

Critical evaluation of SOI design guidelinesRouwaida Kanj, Elyse Rosenbaum. tvlsi, 12(9):885-894, 2004. [doi]

2002

A critical look at design guidelines for SOI logic gatesRouwaida Kanj, Elyse Rosenbaum. iscas 2002: 261-264 [doi]