Tsutomu Hondo - researchr alias

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Viewing Publication 1 - 4 from 4

2007

Detection of CMOS Open Node Defects by Frequency AnalysisHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ieicet, 90-D(3):685-687, 2007. [doi]

2004

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC ComponentHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ieicet, 87-D(3):551-556, 2004. [doi]

2003

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current TestHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ats 2003: 406-411 [doi]

2002

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power SupplyHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ats 2002: 417-422 [doi]

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