Wolfgang Stadler - researchr alias

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Viewing Publication 1 - 17 from 17

2009

CDM tests on interface test chips for the verification of ESD protection conceptsTilo Brodbeck, Kai Esmark, Wolfgang Stadler. mr, 49(12):1470-1475, 2009. [doi]

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technologyMichael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler. mr, 49(12):1455-1464, 2009. [doi]

Reliability aspects of gate oxide under ESD pulse stressAdrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix. mr, 49(12):1407-1416, 2009. [doi]

Do ESD fails in systems correlate with IC ESD robustness?Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner. mr, 49(9-11):1079-1085, 2009. [doi]

Editorial ESD reliability special sectionVesselin K. Vassilev, Wolfgang Stadler. mr, 49(12):1405-1406, 2009. [doi]

2007

Backside interferometric methods for localization of ESD-induced leakage current and metal shortsV. Dubec, Scrgey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler. mr, 47(9-11):1539-1544, 2007. [doi]

Guest editorialWolfgang Stadler. mr, 47(7):999, 2007. [doi]

2006

Physical fundamentals of external transient latch-up and corrective actionsK. Domanski, B. Póltorak, S. Bargstädt-Franke, Wolfgang Stadler, W. Bala. mr, 46(5-6):689-701, 2006. [doi]

2005

Transient latch-up: experimental analysis and device simulationS. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala. mr, 45(2):297-304, 2005. [doi]

Test circuits for fast and reliable assessment of CDM robustness of I/O stagesWolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton. mr, 45(2):269-277, 2005. [doi]

Guest editorialWolfgang Stadler. mr, 45(2):199-200, 2005. [doi]

High abstraction level permutational ESD concept analysisM. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel. mr, 45(2):313-321, 2005. [doi]

Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domainHeinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening. mr, 45(2):279-285, 2005. [doi]

2003

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologiesM. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner. mr, 43(7):1001-1010, 2003. [doi]

2002

Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection DevelopmentWolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik. mr, 42(9-11):1267-1274, 2002. [doi]

2001

Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phaseK. Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner. mr, 41(11):1761-1770, 2001. [doi]

1993

Einführung verteilter Systeme in einem Unternehmen der Markenartikelindustrie - Organisatorische KonsequenzenWolfgang Stadler. kivs 1993: 128-134

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