Call for Papers
International Conference of Testing Software and Systems (ICTSS'12)
November 19-21 2012, Aalborg, Denmark
Testing is one of the most important quality assurance techniques for the (partial) verification of communication and software systems as well as for the validation of their models. Yet, testing remains very challenging in the underlying theory, methods and tools, in industrial use, and in its systematic combined application with other verification techniques.
ICTSS is a series of international conferences addressing the conceptual, theoretic, and practical problems of testing software systems, including communication protocols, services, distributed platforms, middleware, embedded- and cyber-physical-systems, and security infrastructures.
The ICTSS is the successor of previous (joint) conferences TESTCOM and FATES and aims at being a forum for researchers, developers, testers, and users to review, discuss, and learn about new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of communicating systems and software.
Aspects of testing: test derivation, test selection, test coverage, test implementation and execution, test result analysis, test oracles, test management, monitoring and runtime verification, test frameworks
Model-based testing: Formal models and modeling languages such as automata, state machines, process algebra, logics, UML, HOL, Markov-chains, test generation from models, model coverage
Combination of techniques: Techniques that demonstrate how to cleverly and systematically combine testing and formal (model-based) verification and analysis to improve quality and reduce effort
Quality aspects: Functional, interoperability, performance, conformance, security, reliability, robustness, etc.
Application areas: Communicating systems such as protocols, middleware, networks, web services, wireless applications, control systems, business information systems, embedded and real-time software, etc.
Combinations of different testing techniques: In particular combination of techniques for the automated generation of test data
Tools and methods: Automated support of any of the testing activities, rigid testing processes, testing driven development, sound metrics and measurements
Case studies: Case studies and industrial applications involving qualified empirical evaluations
Types of contributions* Research papers (max. 16 pages) describing results of theoretical or experimental research, which must be original, significant, and sound
All contributions to ICTSS'12 have to be submitted electronically in PDF format via easy chair. All submissions have to follow the Springer LNCS paper format.
The submission type according to the categories mentioned under Types of Contributions must be stated explicitly by the author(s) upon submission via the conference website. The submission type influences the review criteria.
Accepted contributions must be presented at the conference. Accepted full papers are published by Springer in the LNCS series (Final Approval Pending). Authors need to sign a copyright transfer form to transfer usage rights on their papers to Springer.
June 11, 2012 Deadline for submission of abstracts June 18, 2012 Deadline for submission of full papers August 8, 2012 Author Notification September 3, 2012 Deadline for Camera ready copy November 19 - 21, 2012 Conference
Brian Nielsen, Aalborg University, DK Carsten Weise, IVU Traffic Technologies, DE
Bernhard K. Aichernig, TU Graz, Austria Ana Cavalli, National Institute of Telecommunications, France Antonia Bertolino, CNR, Italy John Derrick , U Sheffield, United Kingdom Jens Grabowski, U Göttingen, Germany Wolfgang Grieskamp, Google, U.S.A Roland Groz , Grenoble Institute of Technology, France Toru Hasegawa, KDDI R&amb;D Labs, Japan Klaus Havelund, Nasa Jet Propulsion Laboratory, U.S.A Rob Hierons, U Brunel, United Kingdom Teruo Higashino, U Osaka, Japan Thierry Jéron, IRISA Rennes, France Ferhat Khendek, U Concordia, Canada Victor Kuliamin, Russain Academy of Sciences, Russia Bruno Legeard, Smartesting, France Karl Meinke, KTH Royal Institute of Technology, Sweden Zoltan Micskei, Budapest University of Technology and Economics, Hungary Manuel Nuñez, U Complutense de Madrid, Spain Doron Peled, U Bar-Ilan, Israel Alexandre Petrenko , CRIM, Canada Paul Pettersson, U Mälardalerne, Sweden Geguang Pu , ECNU, China Holger Schlingloff, Humboldt University Berlin, Germany Paul Strooper, U of Queensland, Australia Adenilso Simao, U Sao Paulo, Brazil Kenji Suzuki, Kennisbron .Co .Ltd, Japan Nikolai Tillmann Microsoft Research, U.S.A Andreas Ulrich, Siemens AG, Germany Hasan Ural, U Ottawa, Canada Jüri Vain, TU Tallinn, Estonia Nicky Williams, CEA-List, France Burkhart Wolff U Paris-Sud, France Nina Yevtushenko, Tomsk State University, Russia Fatiha Zaidi, U Paris-Sud, France Jian Zhang, Chinese Academy of Science, China