Microelectronics Reliability - researchr journal

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Ling Yu, Peng Xu. Structural health monitoring based on continuous ACO method. Microelectronics Reliability, 51(2):270-278, 2011.
Daniel Fernández, Jordi Madrenas, Jordi Cosp. A self-test and dynamics characterization circuit for MEMS electrostatic actuators. Microelectronics Reliability, 51(3):602-609, 2011.
Fei Su, Ronghai Mao, Xiaoyan Wang, Guangzhou Wang, Haiyan Pan. Creep behaviour of Sn-3.8Ag-0.7Cu under the effect of electromigration: Experiments and modelling. Microelectronics Reliability, 51(5):1020-1024, 2011.
L. Lachéze, O. Latry, P. Dherbécourt, K. Mourgues, V. Purohit, H. Maanane, J. P. Sipma, F. Cornu, Ph. Eudeline. Characterization and modeling of hot carrier injection in LDMOS for L-band radar application. Microelectronics Reliability, 51(8):1289-1294, 2011.
Charles J. Vath III, M. Gunasekaran, Ramkumar Malliah. Factors affecting the long-term stability of Cu/Al ball bonds subjected to standard and extended high temperature storage. Microelectronics Reliability, 51(1):137-147, 2011.
Robert O Connor, Greg Hughes. The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers. Microelectronics Reliability, 51(3):524-528, 2011.
Vladimir Milovanovic, Ramses van der Toorn, Ralf Pijper. RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions. Microelectronics Reliability, 51(3):560-565, 2011.
Jungwoo Joh, Jesús A. del Alamo, Kurt Langworthy, Sujing Xie, Tsvetanka Zheleva. Role of stress voltage on structural degradation of GaN high-electron-mobility transistors. Microelectronics Reliability, 51(2):201-206, 2011.
Jie Han, Hao Chen, Erin Boykin, José A. B. Fortes. Reliability evaluation of logic circuits using probabilistic gate models. Microelectronics Reliability, 51(2):468-476, 2011.
Seyyed Javad Seyyed Mahdavi, Karim Mohammadi. Improved single-pass approach for reliability analysis of digital combinational circuits. Microelectronics Reliability, 51(2):477-484, 2011.