Probabilistic Gate Level Fault Modeling for Near and Sub-Threshold CMOS Circuits

Alexandru Amaricai, Sergiu Nimara, Oana Boncalo, Jiaoyan Chen, Emanuel M. Popovici. Probabilistic Gate Level Fault Modeling for Near and Sub-Threshold CMOS Circuits. In 17th Euromicro Conference on Digital System Design, DSD 2014, Verona, Italy, August 27-29, 2014. pages 473-479, IEEE, 2014. [doi]

Abstract

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