Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De, T. M. Mak. Statistical Estimation of Correlated Leakage Power Variation and Its Application to Leakage-Aware Design. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 606-612, IEEE Computer Society, 2006. [doi]
Abstract is missing.