Salomon Beer, Ran Ginosar, Michael Priel, Rostislav (Reuven) Dobkin, Avinoam Kolodny. An on-chip metastability measurement circuit to characterize synchronization behavior in 65nm. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2593-2596, IEEE, 2011. [doi]
Abstract is missing.