N. Buard, F. Miller, C. Ruby, R. Gaillard. Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 63-70, IEEE Computer Society, 2007. [doi]
Abstract is missing.