Domain fault model and coverage metric for SoC verification - researchr publication

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Luo Chun, Yang Jun, Gao Gugang, Shi Longxing. Domain fault model and coverage metric for SoC verification. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 5662-5665, IEEE, 2005. [doi]

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