Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology - researchr publication authors

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T. Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier. Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectronics Reliability, 50(9-11):1367-1372, 2010. [doi]

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