T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud. A built-in self test scheme for VLSI. In Isao Shirakawa, editor, Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29 - September 1, 1995. ACM, 1995. [doi]
@inproceedings{DamarlaSMCS95,
title = {A built-in self test scheme for VLSI},
author = {T. Raju Damarla and Wei Su and Gerald T. Michael and Moon J. Chung and Charles E. Stroud},
year = {1995},
doi = {http://dx.doi.org/10.1145/224818.224901},
tags = {testing},
researchr = {http://researchr.org/publication/DamarlaSMCS95},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29 - September 1, 1995},
editor = {Isao Shirakawa},
publisher = {ACM},
isbn = {0-89791-766-9},
}