On-Chip Test Generation Using Linear Subspaces

Ramashis Das, Igor L. Markov, John P. Hayes. On-Chip Test Generation Using Linear Subspaces. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 111-116, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.