Basab Datta, Wayne P. Burleson. Circuit-level NBTI macro-models for collaborative reliability monitoring. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 453-458, ACM, 2010. [doi]
Abstract is missing.