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Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits

Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir. Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 794-799, IEEE, 2011. [doi]

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