Alexandre Peixoto Ferreira, Miao Zhou, S. Bock, Bruce R. Childers, Rami G. Melhem, Daniel Mossé. Increasing PCM main memory lifetime. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 914-919, IEEE, 2010. [doi]
Abstract is missing.