Dinesh D. Gaitonde, Duncan M. Hank Walker. Test quality and yield analysis using the DEFAM defect to fault mapper. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 202-205, IEEE Computer Society, 1993. [doi]
Abstract is missing.