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Radiation-hardened techniques for CMOS flash ADC

Umberto Gatti, Cristiano Calligaro, Evgeny Pikhay, Yakov Roizin. Radiation-hardened techniques for CMOS flash ADC. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 1-4, IEEE, 2014. [doi]

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