Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Valentin Gherman, Michael Garbers, Jürgen Schlöffel. Implementing a Scheme for External Deterministic Self-Test. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 101-106, IEEE Computer Society, 2005. [doi]
Abstract is missing.