Study of current saturation behaviors in dual direction SCR for ESD applications

Yan Han, Bo Song, Shurong Dong, Mingliang Li, Fei Ma, Meng Miao, Kehan Zhu. Study of current saturation behaviors in dual direction SCR for ESD applications. Microelectronics Reliability, 51(2):332-336, 2011. [doi]

Abstract

Abstract is missing.