Multi-temperature testing for core-based system-on-chip

Zhiyuan He, Zebo Peng, Petru Eles. Multi-temperature testing for core-based system-on-chip. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 208-213, IEEE, 2010. [doi]

Abstract

Abstract is missing.