Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET s (n-DTMOSFET) measured by gated-diode configuration

Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang. Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET s (n-DTMOSFET) measured by gated-diode configuration. Microelectronics Reliability, 43(5):707-711, 2003. [doi]

Abstract

Abstract is missing.