Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation

Jinseob Jeong, Seungwhun Paik, Youngsoo Shin. Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 629-634, IEEE, 2008. [doi]

@inproceedings{JeongPS08,
  title = {Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation},
  author = {Jinseob Jeong and Seungwhun Paik and Youngsoo Shin},
  year = {2008},
  doi = {http://dx.doi.org/10.1109/ASPDAC.2008.4484028},
  researchr = {http://researchr.org/publication/JeongPS08},
  cites = {0},
  citedby = {0},
  pages = {629-634},
  booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
  publisher = {IEEE},
}