Jinseob Jeong, Seungwhun Paik, Youngsoo Shin. Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 629-634, IEEE, 2008. [doi]
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