Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs - researchr publication authors

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Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger. Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 218-227, IEEE Computer Society, 2003. [doi]

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