Post-silicon skew tuning algorithm utilizing setup and hold timing tests

Mineo Kaneko, Jian Li. Post-silicon skew tuning algorithm utilizing setup and hold timing tests. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 125-128, IEEE, 2012. [doi]

Abstract

Abstract is missing.