Fernanda Lima Kastensmidt, Jorge Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost. Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectronics Reliability, 54(9-10):2344-2348, 2014. [doi]
Abstract is missing.