Amin Khajeh, Aseem Gupta, Nikil Dutt, Fadi J. Kurdahi, Ahmed M. Eltawil, Kamal S. Khouri, Magdy S. Abadir. TRAM: A tool for Temperature and Reliability Aware Memory Design. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 340-345, IEEE, 2009. [doi]
Abstract is missing.