Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits

Chun-Yi Kuo, Chi-Jih Shih, Yi-Chang Lu, James Chien-Mo Li, Krishnendu Chakrabarty. Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits. IEEE Trans. VLSI Syst., 22(3):667-674, 2014. [doi]

Abstract

Abstract is missing.