Lucas Layman, Gunnar Kudrjavets, Nachiappan Nagappan. Iterative identification of fault-prone binaries using in-process metrics. In H. Dieter Rombach, Sebastian G. Elbaum, Jürgen Münch, editors, Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany. pages 206-212, ACM, 2008. [doi]
Abstract is missing.