Tien-Duy B. Le, David Lo, Claire Le Goues, Lars Grunske. A learning-to-rank based fault localization approach using likely invariants. In Andreas Zeller, Abhik Roychoudhury, editors, Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016. pages 177-188, ACM, 2016. [doi]
Abstract is missing.