Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification

Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco. Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 24, ACM, 2016. [doi]

Abstract

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