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Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain

Jong-Hoon Lee, Seul Ki Yu, Jae-Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong-Tae Park. Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectronics Reliability, 64:580-584, 2016. [doi]

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