Effect of gate barrier and channel buffer layer on electric properties and transparence of the a-IGZO thin film transistor

Cheng-I. Lin, Yean-Kuen Fang, Wei-Chao Chang, Mao-Wei Chiou, Chih-Wei Chen. Effect of gate barrier and channel buffer layer on electric properties and transparence of the a-IGZO thin film transistor. Microelectronics Reliability, 54(5):905-910, 2014. [doi]

Abstract

Abstract is missing.