A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment

Xiao Liu, Qiang Xu. A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1494-1499, IEEE, 2009. [doi]

Abstract

Abstract is missing.