Identifying Aspects Using Fan-In Analysis

Marius Marin, Arie van Deursen, Leon Moonen. Identifying Aspects Using Fan-In Analysis. In 11th Working Conference on Reverse Engineering (WCRE 2004), 8-12 November 2004, Delft, The Netherlands. pages 132-141, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.