Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo Augusto da Luz Reis. Impact of gate workfunction fluctuation on FinFET standard cells. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 574-577, IEEE, 2014. [doi]
Abstract is missing.