Theoretical analysis for low-power test decompression using test-slice duplication

Szu-Pang Mu, Mango Chia-Tso Chao. Theoretical analysis for low-power test decompression using test-slice duplication. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 147-152, IEEE Computer Society, 2010. [doi]

Abstract

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