Statistical Delay Fault Coverage and Defect Level for Delay Faults - researchr publication

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Eun Sei Park, Thomas W. Williams, M. Ray Mercer. Statistical Delay Fault Coverage and Defect Level for Delay Faults. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 492-499, IEEE Computer Society, 1988.

Abstract is missing.