An on-chip clock generation scheme for faster-than-at-speed delay testing

Songwei Pei, Huawei Li, Xiaowei Li. An on-chip clock generation scheme for faster-than-at-speed delay testing. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1353-1356, IEEE, 2010. [doi]

Abstract

Abstract is missing.