Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty. High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1426-1431, IEEE, 2010. [doi]
Abstract is missing.